Christopher D. Ziomek and Matthew T. Hunter Ph.D
ZTEC Instruments, Inc. Albuquerque, New Mexico, USA
This paper discusses practical constraints of Error Vector Magnitude (EVM) measurements for high-coverage Radio Frequency Integrated Circuit (RFIC) device testing. Noise, distortion, spurious signals, and phase noise all degrade EVM, and therefore EVM provides a comprehensive measure of an RFIC’s quality of use in digital communications. New wireless standards with large instantaneous bandwidths, such as 802.11ac WLAN and LTE-Advanced, make EVM thresholds more difficult to achieve. This paper describes techniques to optimize test equipment setup and operation to extend the useable range in frequency, power and instantaneous bandwidth of EVM-based testing.
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