Attendance and lunch is free.

Come to explore how the PXI platform can offer cost effective test solutions for verification, failure analysis, pilot production, and focused production test applications. We encourage Semiconductor Test engineers, Engineers involved in design and test devices, SoCs and hybrids and any other professionals involved in test validation to join us for lunch!

Objectives

• Learn about performance digital test using PXI instrumentation and pre-configured PXI semiconductor test systems
• Understand how PXI’s open architecture can be used to configure application specific solutions
• Gain knowledge about load board design and unique device socket options

Agenda

Want to come?

Located at the Embassy Suites Santa Clara
2885 Lakeside Drive
Santa Clara, CA 95054
1-408-496-6400

Registration is required click here for more details!

Link to the symposium: http://hias.anu.edu.au/2012/

In Baltimore, IEEE AUTOTESTCON is the United States’ largest conference focused on automatic test systems for US military systems, and has been held annually since 1965. The Conference, whose general theme is The Support Systems Technology Conference, is held in varying cities around the US each fall. Administered by a standing Board of Directors, the Conference typically presents over 120- quality application-focused papers with over 250 Exhibits, all focused precisely on the current issues facing military automated test. Attendance ranges between 650 and 750 (paid) attendees, with an additional 1,000 to 1,200 exhibitor and spouse attendees.

The most exciting part of the show for ZTEC Instruments at ATC, was announcing our new instrument ZT8651 Vector Signal Analyzer, the release of our 2012 Catalog, and our exciting announcement regarding our selection from Lockheed Martin and AAI in the US Navy’s eCASS Program. ZTEC Instruments had a great booth, great attendance, and best of all, great reception from the crowd!

Our attendance at the International Test Conference in Anaheim, California was more than exciting! Partnered with Geotest, the team showcased our recently released ZT8651 Vector Signal Analyzer with rave reviews and great feedback.

ZTEC Instruments is no stranger to Autotestcon and ITC, but we all agree, these two events back to back really helped spin great momentum into 2012! We have already begun planning for many more tradeshows in 2012, we hope to see you!

ZTEC Instruments was recently recognized as one of the best technology companies in the state of New Mexico by Business Weekly for the seventh consecutive year!

ZTEC Instruments enjoyed a luncheon held at the New Mexico Lobos newly renovated basketball arena called “The Pit.” Each CEO or representative from their respective companies were asked to run down the large tunnel onto the court and attempt to make a free throw shot. Needless to say, very few made the shot, and unfortunately our CEO Christopher Ziomek was no exception, though, he made a valiant effort.

ZTEC Instruments is proud of its successes and recognition! We are on a steady track to once again be recognized in 2012.  We know that because of our sincere efforts toward lasting relationships with you, our clients, we can continue to be recognized as one of the leading companies in technology in the state of New Mexico.

Chris at The Pit:

ZTEC Instruments was highlighted as a sponsor in the opening ceremonies, and with over 300 people in attendance, ZTEC Instruments felt proud to support and attend this great event. We look forward to future attendance, opportunities, and relationships we hope to gain while attending the Test Week Conference each year.

In addition to attendance at this great event ZTEC Instruments, has announced a new differential (DF) analog front end option for its ZT4400 series-to read more please click here!

Images From The Event:

Recap :

In March, the VP of Sales and Marketing, Gary Tilley and application engineer Shawn Knapp attended the Particle Accelerator Conference in New York City.

PAC is the latest in the highly successful series of Particle Accelerator Conferences and also the first regional North American PAC organized to attract accelerator scientists, engineers, students and industrial exhibitors interested in every aspect of the science and technology of particle accelerators.

The most exciting part of the show for ZTEC Instruments, was announcing our upgraded LXI M-Class oscilloscopes with embedded EPICS IOC! Upgrades to the LXI platform include Gigabit LAN and faster processing, along with data downloads to save time by improving responsiveness and data transfer rates. Upgrades to the ZTEC Experimental Physics and Industrial Control System (EPICS) input/output controller (IOC) include improved waveform updates and additional, user-configurable environment variables, making it easier for engineers to get their systems up and running faster.

ZTEC Instruments plans on attending more PAC events in the future and we hope to see you there!

Our booth:

In September, a whole bunch of the ZTEC Instruments team attended the 2010 Autotestcon Conference in Orlando, Florida.

IEEE AUTOTESTCON is the United States’ largest conference focused on automatic test systems for US military systems, and has been held annually since 1965. The Conference, whose general theme is The Support Systems Technology Conference, is held in varying cities around the US each fall. Administered by a standing Board of Directors, the Conference typically presents over 120- quality application-focused papers with over 250 Exhibits, all focused precisely on the current issues facing military automated test. Attendance ranges between 650 and 750 (paid) attendees, with an additional 1,000 to 1,200 exhibitor and spouse attendees.

The most exciting part of the show for ZTEC Instruments, was announcing our new product line offering of RF Test Equipment! ZTEC Instruments had a great booth, great attendance, and best of all, great reception from the crowd regarding everything!

ZTEC Instruments is no stranger to Autotestcon, but we all agree, this was one of our favorite events yet! We are already started to plan for 2011 in Baltimore!

Some Autotestcon 2010 Pictures!

Our booth at Autotestcon 2010

Our CTO, Dr. Hunter, presenting his paper on The Fundamentals of Modern Spectral Analysis

The ZTEC Instruments Staff at the show

Dr. Hunter, our CTO, speaking on a (large) panel regarding the future of synthetic instrumentation.

The test set offers 1-Hz frequency resolution and a 150-MHz modulation bandwidth.

Rick Nelson, Chief Editor — Test & Measurement World, 9/20/2010 9:34:45 AM

See more at: http://www.tmworld.com/article/510529-ZTEC_debuts_9_GHz_PXI_test_set_at_Autotestcon.php

ZTEC Instruments at Autotestcon introduced its ZT8101 RF test set, which includes three PXI instruments: the ZT8441 RF/IF digitizer, the ZT8711 local-oscillator synthesizer, and the ZT8611 RF downconverter.

The test set operates from 100 MHz to 1, 3, 6, or 9 GHz, offers 1-Hz frequency resolution, faster than 100-µs switching time, better than 75-dB spurious-free dynamic range, and a 150-MHz modulation bandwidth. Level range is -130 to +30 dBm; phase noise at 9 GHz is -103 dBc/Hz at a 10-kHz offset.

The test-set introduction follows on ZTEC’s July announcement that it would enter the RF test equipment market with its ZT8441 RF/IF digitizer, available in PXI, PCI, VXI, and LXI form factors. ZTEC Instruments’ CEO Christopher Ziomek said at the time that ZTEC had teamed with Astronics DME to jointly develop the high performance RF/IF digitizer, adding, “Expanding into the RF market was a natural technological adjacency for us. In fact, some of our customers are already using our current products for RF solutions.” Ziomek said at Autotestcon that the work with Astronics DME continues with the debut of the ZT8101 test set.

Astronics DME GM and executive VP Brian Price said in July that teaming with ZTEC allowed Astronics DME to deliver its RTS intellectual property to a broader customer base. The ZTEC ZT8441, he said, includes Astronics DME’s wideband digital down converter (DDC) FPGA IP.

The ZT8441 RF/IF digitizer comes standard with an on-instrument spectrum analyzer. It includes a real-time quadrature digital downconverter (DDC) with fractional resampling and decimation, vector signal analysis capability with a 156.25-MHz instantaneous bandwidth, a low noise floor and a high dynamic range, fast switching and all-digital frequency hopping, and real-time flexible FPGA processing.

The ZTEC RF products leverage the company’s ZSignal software, which can ease the transition from a bench-top to modular instrument environment.

http://www.ztecinstruments.com.

Written by :

Matthew T. Hunter, ZTEC Instruments, Orlando, Florida 32826, Email: mhunter@ztecinstruments.com

Achilleas G. Kourtellis, Astronics DME Corporation, Orlando, Florida 32826, Email: achilleas.kourtellis@astronics.com

Christopher D. Ziomek, ZTEC Instruments, Albuquerque, New Mexico 87109, Email: cziomek@ztecinstruments.com

Wasfy B. Mikhael, University of Central Florida, Orlando, Florida 32816, Email: mikhael@mail.ucf.edu

Abstract :

Digital Signal Processing (DSP) has revolutionized spectral analysis. Where the swept spectrum analyzer dominated the market in the past, the Fast Fourier Transform (FFT) based spectrum analyzer is now gaining acceptance as the method of choice. This is due in part to the prevalence of high speed, high dynamic range Analog-to-Digital Converters (ADC) and high speed signal processing devices such as Field Programmable Gate Arrays (FPGA). Because the FFT-based spectrum analyzer is readily implemented with a limited set of generic hardware, it is an attractive technique for Synthetic Instruments (SI), where the goal is to form multiple measurement functions from a limited set of generic hardware modules.

In this paper some of the fundamental design parameters and specifications of modern spectrum analyzers such as dynamic range, instantaneous bandwidth, and image rejection are presented. These parameters are explored with a focus on maintaining system performance without sacrificing flexibility.

To download this paper as a PDF, please click here: ATC2010_Paper_published

To download the adjacent presentation, please click here: AUTOTESTCON_2010_Presentation-1

ZTEC Instruments Introduces Cutting-Edge RF Test Set Product

Revolutionary Vector Signal Analysis RF Test Set Introduced to RF Market by ZTEC Instruments

Orlando, FL (September 14, 2010) – ZTEC Instruments (http://www.ztecinstruments.com), the leader in modular oscilloscopes and waveform generators, announced today that it will further its expansion into the RF Test Equipment market with the introduction of its latest product, the ZT8101 RF Test Set (http://www.ztecinstruments.com/products/rf-test-equipment.php).

The ZT8101 Test Set is comprised of three unique PXI instruments, the ZT8441 RF/IF Digitizer, the ZT8711 LO Synthesizer, and the ZT8611 RF Downconverter.   ZTEC Instruments teamed again with Astronics DME Corporation (NASDAQ: ATRO, http://astronics.com) to jointly develop this RF Test Set.

“We are excited to announce this revolutionary instrument set; it is truly synthetic, flexible, future-proof hardware, compatible with 3^rd party RF instruments for frequency range extension,” says ZTEC Instruments Chief Technical Officer Dr. Matthew T. Hunter, Ph. D., who speared-headed the project.  “Alone, the ZT8101 RF Test Set delivers general purpose, image free signal analysis up to 9GHz.  Additionally, the ZT8101 can be paired with other third party instruments, like the Phase Matrix Preselector (PXI-1420) and Microwave Downconverter (PXI-1410), providing frequency range extension to 26.5 GHz”

The ZT8101 Test Set comes standard with

• Ultra wide 150 MHz modulation bandwidth to meet current and future communication protocols including JTRS, WCDMA, LTE, and WiMax.
• Vector signal analysis capability for complex digital modulation analysis including error vector magnitude (EVM) and adjacent channel power measurement
• Compatibility features for 3^rd party RF instruments for frequency range extension
• Synthetic, flexible, future-proof hardware
• Image free down conversion for high performance spectral analysis, spur search, and false measurement avoidance
• Full-featured ZSignal Spectrum Analyzer GUI

The ZT8101 RF Test Set leverages ZTEC Instruments’ value-add to modular instruments by providing an intuitive GUI, ZSignal^TM.  ZSignal^TM provides advanced integration and support with a simple and familiar interface to ease the transition from a bench-top spectrum analyzer to its modular instrument counterpart. ZSignal^TM was built in accordance with award-winning ZScope^® and ZWave^® platforms to minimize the time needed to integrate the instrument into both new and legacy software.

“The development of these instruments with ZTEC Instruments was a logical step in technology progression from our ATACTS product line to an advanced PXI RF measurement set further expanding the performance parameters,” says Lou Salzano, Astronics Corporation Vice-President of Test Solutions. “The PXI format allows the instruments to be used as part of a small standalone measurement set or integrated into a larger ATE system.”
“ZTEC Instruments is extremely pleased to once again be working side-by-side with Astronics DME Corporation to provide the smallest footprint RF Test Set to support the next generation military and aerospace RF test requirements,” says Christopher Ziomek, President of ZTEC Instruments. “This technology will help both ZTEC Instruments and Astronics Corporation further serve their customers in the various branches of the US military, including the US Marine Corps and the US Navy.”

About ZTEC Instruments

ZTEC Instruments is a leading modular instrument company whose product focus includes oscilloscopes, waveform generators, and RF Test Equipment. ZTEC Instruments’ products are unique in that they provide powerful bench-top instrument capabilities in modular instrument form factors, including PCI, Compact PCI/PXI, VXI, and LXI. For more information about ZTEC Instruments and how our products can address your test and measurement needs, please visit http://www.ztecinstruments.com.

About Astronics Corporation

Astronics Corporation is a leader in advanced, high performance lighting, electrical power and automated test systems for the global aerospace and defense industries. The Company’s strategy is to develop and maintain positions of technical leadership in its chosen aerospace and defense markets, to leverage those positions to grow the amount of content and volume of product it sells to those markets and to selectively acquire businesses with similar technical capabilities that could benefit from our leadership position and strategic direction. Astronics Corporation, and its wholly-owned subsidiaries, DME Corporation, Astronics Advanced Electronic Systems Corp. and Luminescent Systems Inc., have a reputation for high quality designs, exceptional responsiveness, strong brand recognition and best-in-class manufacturing practices. The Company routinely posts news and other important information on its website at http://www.astronics.com.  For more information on Astronics and its products, visit its website at http://www.astronics.com

Safe Harbor Statement (Astronics Corporation)

This press release contains forward-looking statements as defined by the Securities Exchange Act of 1934. One can identify these forward-looking statements by the use of the words “expect,” “anticipate,” “plan,” “may,” “will,” “estimate” or other similar expression. Because such statements apply to future events, they are subject to risks and uncertainties that could cause the actual results to differ materially from those contemplated by the statements. Important factors that could cause actual results to differ materially include the state of the aerospace and defense industry, the market acceptance of newly developed products, internal production capabilities, the timing of orders received, the status of customer certification processes, the demand for and market acceptance of new or existing aircraft which contain the Company’s products, customer preferences, and other factors which are described in filings by Astronics with the Securities and Exchange Commission. The Company assumes no obligation to update forward-looking information in this press release whether to reflect changed assumptions, the occurrence of unanticipated events or changes in future operating results, financial conditions or prospects, or otherwise.

# # #

To download the datasheet, please click here: LO_RES_8101

To download this press release as a PDF, please click here: 100914_ZT8101-ProductAnnouncement3

To visit the 8101 home page, please click here: http://www.ztecinstruments.com/products/rf-test-equipment/series/ZT8101/