• Analogic DBS901
• Analogic DBS907AB + DBS9905
• Racal 3153
• Symmetricom bc824VXI
• Tektronix TVS621
• LeCroy’s PXD 222

To view the complete article in HTML format, please click here: ZTEC Instruments brings you Replacement SOLUTIONS!

• Papers & News: Extending the Useable Range of Error Vector Magnitude (EVM) Testing
• NEW: ZProtocol has arrived!
• Events:
  • SEMICON WEST: July 10th-12th the ZTEC
  • SILICON VALLEY TEST CONF. In August

To view the complete newsletter in HTML format, please click here: NEWS-ZTECConnect_Q.2’2012.

Abstract

This paper discusses the practical constraints of testing Radio Frequency Integrated Circuit (RFIC) devices in a Multiple-Input Multiple-Output (MIMO) topology. Techniques to optimize test equipment setup and operation for MIMO architectures are detailed. Because RFICs are tested at a device level, this paper focuses on MIMO compliance testing and characterization within a cabled RF environment without open-air antennas. The IEEE 802.11 WLAN protocol is used as an example to detail the theory, specific use cases, and test scenarios.

1. Introduction

The drive to increase wireless data rates within the limited radio frequency (RF) spectrum has led to radios with capabilities beyond a single-input single-output (SISO) topology. SISO radio devices use one transmitter and one receiver to send data over a single RF channel. Recently introduced wireless protocols have adopted Multiple-Input Multiple-Output (MIMO) topologies that use two or more transmitters and two or more receivers to send data simultaneously over the same RF bandwidth. For example, the IEEE 802.11n/ac WLAN and IEEE 802.16e WiMAX standards include MIMO functionality.

In this paper, we discuss MIMO RF topologies and the implications of MIMO on Radio Frequency Integrated Circuit (RFIC) test. Because MIMO topologies make use of multi-path signal transmission in a highly-scattered open-air environment, there are implications when testing MIMO RFIC devices in a cabled RF environment. This paper focuses on verification of MIMO RFIC performance using a cabled RF test topology. We use IEEE 802.11 WLAN to illustrate the details of MIMO test equipment setup and operation for a specific protocol.

Read More
Full Paper (.pdf): MIMO_RFIC Test_Architectures

Attendance and lunch is free.

Come to explore how the PXI platform can offer cost effective test solutions for verification, failure analysis, pilot production, and focused production test applications. We encourage Semiconductor Test engineers, Engineers involved in design and test devices, SoCs and hybrids and any other professionals involved in test validation to join us for lunch!

Objectives

• Learn about performance digital test using PXI instrumentation and pre-configured PXI semiconductor test systems
• Understand how PXI’s open architecture can be used to configure application specific solutions
• Gain knowledge about load board design and unique device socket options

Agenda

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Santa Clara, CA 95054
1-408-496-6400

Registration is required click here for more details!

Link to the symposium: http://hias.anu.edu.au/2012/

“MIL/Aero ATE systems with RF/microwave test capabilities are designed to be used for a number of years before being upgraded or replaced. However, the need to continue supporting legacy test program sets (TPS) greatly influences upgrade/replace decisions. Sometimes, these are prompted by test-instrument obsolescence. Other times, technology becomes available that could significantly improve the original ATE specification.”

The full Evaluation Engineering article can be found here:

Upgrade or Replace: The MIL/Aero ATE Dilemma

Computer Science, Electrical Engineering, or Computer Engineering undergraduate student, or equivalent experience/education.

RESPONSIBILITIES:

Support the design team in the creation, validation and testing of data acquisition and control software and electronic hardware for modular instrumentation.  Support programming in multiple languages is expected to create automated test scripts for hardware and software validation.  Create instrumentation drivers and convert existing drivers to new languages.

QUALIFICATIONS:

Candidate must be enrolled in a CS, EE, CompE, or related undergraduate program. Candidate must be able to effectively communicate thoughts, ideas, and points of view in a high-paced, dynamic environment.  Candidate must be self-motivated and exhibit a drive and energy level to successfully meet all goals without sacrificing quality and integrity.  Candidate must be detail oriented and have strong organizational skills.

HELPFUL EXPERIENCE:

• C/C++
• LabWindows / LabVIEW
• Visual Basic
• Linux and Windows systems
• Batch and shell scripting
• Subversion revision control software
• InstallShield

ZTEC Instruments is an Equal Opportunity Employer dedicated to workforce diversity. Please send résumés to rd_jobs@ztecinstruments.com

Abstract

This paper discusses practical constraints of Error Vector Magnitude (EVM) measurements for high-coverage Radio Frequency Integrated Circuit (RFIC) device testing. Noise, distortion, spurious signals, and phase noise all degrade EVM, and therefore EVM provides a comprehensive measure of an RFIC’s quality of use in digital communications. New wireless standards with large instantaneous bandwidths, such as 802.11ac WLAN and LTE-Advanced, make EVM thresholds more difficult to achieve. This paper describes techniques to optimize test equipment setup and operation to extend the useable range in frequency, power and instantaneous bandwidth of EVM-based testing.

Full Paper:

EVM Optimization (PDF)

About ZTEC Instruments

ZTEC Instruments is a leading modular instrument company whose product focus includes oscilloscopes, waveform generators, and RF & wireless communication test equipment. ZTEC Instruments’ products are unique in that they provide powerful bench-top instrument capabilities in modular instrument form factors, including PXIe, Compact PCI/PXI, PCI, VXI, and LXI. For more information about ZTEC Instruments and how our products can address your test and measurement needs, please visit http://www.ztecinstruments.com.

RESPONSIBILITIES:

Be a part of the design team in the development of data acquisition and control hardware and software for modular instrumentation.

• Responsible for design and development of engineering and manufacturing test for data capture and signal generation products.  The ability to design and implement test environments for validation and characterization testing of engineering prototypes to full manufacturing test programs.
  • Develop automated test code for validation and characterization of engineering prototype designs.
  • Candidate must have the ability to create software using C for testing, analysis and design modification of circuitry.
  • Candidate should feel confident using Microsoft Visual Studio and TI Code Composer environments.
  • Candidate will be responsible for analyzing test data for failure trend analysis, manufacturing test limit margin analysis, etc.

QUALIFICATIONS:

• Experience: 1 – 5 years of experience with engineering and manufacturing test development
• Familiarity with digital, analog and mixed-signal circuit designs. Circuit design experience should include understanding of:
  • Embedded digital signal processors (TI preferably), FPGAs (Xilinx and Altera), memory and peripheral interfaces.
  • High-speed digital busses (PCI, PCIe, etc).
  • High-precision analog input/output (op-amps, filters, signal converters).
  • Both linear and DC-DC power supplies.
• Candidate must have good hands-on troubleshooting and debugging skills and have familiarity with standard lab test equipment.
• Candidate must be self-motivated and exhibit a drive and energy level to successfully meet all goals against compressed schedules without sacrificing quality or integrity.
• Candidate must be able to effectively communicate thoughts, ideas, and points of view in a high-paced, dynamic environment.

EDUCATION:

• MSEE or BSEE with equivalent experience

LOCATION:

Position will be located in Albuquerque, NM

ZTEC Instruments is an Equal Opportunity Employer dedicated to workforce diversity. Please send résumés to rd_jobs@ztecinstruments.com

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