Category Archives: Events

4.5.12 Event: ZTEC Instruments, Geotest, and Robson Technologies will be hosting a lunch seminar May 15th in Santa Clara, CA.

Come to explore how the PXI platform can offer cost effective test solutions for verification, failure analysis, pilot production, and focused production test applications. Continue reading →

3.28.12 Event: ZTEC Instruments will be seen down under!

Scientific Devices Australia will be showcasing our ZT8441 at the Heavy Ion Accelerator Symposium at the Australian National University in the month of April. Below is the brochure that will be handed out to conference participants. (.pdf attached) Continue reading →

10.20.11 Event Recap: Autotestcon and International Test Conference

In September, the ZTEC Instruments team went bicoastal in a ten day period of time! We attended the 2011 Autotestcon Conference in Baltimore, Maryland, and the 2011 International Test Conference in collaboration with Geotest in Anaheim, California. Continue reading →

7.7.11 2011 Flying 40 Awards

The New Mexico Technology Flying 40 awards annually recognize the 40 fastest-growing technology companies headquartered in New Mexico. Continue reading →

7.6.11 Event Recap: Test Week 2011

In June, Geoff Hoekstra our National Sales Manager, and Gary Tilley our Vice President of Sales and Marketing attended the Test Week Conference in Huntsville, AL. Continue reading →

4.4.11 Event Recap: PAC 2011- New York City, NY

In March, the VP of Sales and Marketing, Gary Tilley and application engineer Shawn Knapp attended the Particle Accelerator Conference in New York City. Continue reading →

9.20.10 Event Recap: Autotestcon 2010- Orlando, Florida

Recap : In September, a whole bunch of the ZTEC Instruments team attended the 2010 Autotestcon Conference in Orlando, Florida. IEEE AUTOTESTCON is the United States’ largest conference focused on automatic test systems for US military systems, and has been … Continue reading →

9.20.10 Media Coverage: Test & Measurement World

ZTEC debuts 9-GHz PXI test set at Autotestcon The test set offers 1-Hz frequency resolution and a 150-MHz modulation bandwidth. Rick Nelson, Chief Editor — Test & Measurement World, 9/20/2010 9:34:45 AM See more at: http://www.tmworld.com/article/510529-ZTEC_debuts_9_GHz_PXI_test_set_at_Autotestcon.php ZTEC Instruments at Autotestcon … Continue reading →

9.14.10 Technical Paper: Fundamentals of Modern Spectral Analysis

Presented at Autotestcon, ©2010 IEEE Written by : Matthew T. Hunter, ZTEC Instruments, Orlando, Florida 32826, Email: mhunter@ztecinstruments.com Achilleas G. Kourtellis, Astronics DME Corporation, Orlando, Florida 32826, Email: achilleas.kourtellis@astronics.com Christopher D. Ziomek, ZTEC Instruments, Albuquerque, New Mexico 87109, Email: cziomek@ztecinstruments.com … Continue reading →

9.14.10 Press Release: ZTEC Instruments Introduces Cutting-Edge RF Test Set Product

Just announced at Autotestcon 2010: ZTEC Instruments Introduces Cutting-Edge RF Test Set Product Revolutionary Vector Signal Analysis RF Test Set Introduced to RF Market by ZTEC Instruments Orlando, FL (September 14, 2010) – ZTEC Instruments (http://www.ztecinstruments.com), the leader in modular … Continue reading →