Category Archives: Technical Papers

8.24.10 Blog Post: All About ARBS (Waveform Generators)

The editors at Evaluation Engineering approached us and asked to give them some content and feedback on a few questions on all-things Arbitrary Waveform Generators (also referred to sometimes as Function Generators). So we talked over the questions, and came … Continue reading →

8.4.10 Technical Paper: Optimal Block Adaptive I/Q Mismatch Compensation Based on Circularity

ZTEC Instruments’ supports student success at the 53rd IEEE International Midwest Symposium on Circuits and Systems. UCF Student, Ying Liu presents her paper, “Optimal Block Adaptive I/Q Mismatch Compensation Based on Circularity.” Abstract: In this paper, a novel fast-converging circularity … Continue reading →

5.24.10 Technical Paper: Off-the-shelf EPICS Instrumentation for Remote Waveform Monitoring & Analysis

Abstract-
Off-the-shelf instruments based on the LAN eXtensions for Instrumentation (LXI) standard that include embedded EPICS input/output controllers (IOCs) are an ideal solution for many particle accelerator applications. These applications require responsive remote control and realtime waveform monitoring for critical accelerator systems including machine protection and beam position monitoring. These instruments… Continue reading →

5.3.10 Technical Paper: Advanced Modular Oscilloscopes and Digitizers Optimized for Accelerator Applications

Abstract – Modular oscilloscopes and digitizers, including those with embedded EPICS IOCs, provide powerful off-the-shelf solutions for accelerator controls and beamline data acquisition applications requiring fast sampling, high resolution and/or tight multi-channel synchronization. This presentation discusses features and capabilities of EPICS and non-EPICS LXI, VXI, PXI and PCI oscilloscopes … Continue reading →

11.11.09 Technical Paper: Waveform Generator Fundamentals

This is an elementary paper that describes, in detail the characteristics and applications of arbitrary waveform generators. Continue reading →

9.9.09 Technical Paper: Advanced Waveform Generation Techniques for ATE

Presented at Autotestcon, ©2009 IEEE Written by : Christopher D. Ziomek, President & Emily Jones, Coordinator Abstract : Comprehensive waveform generation is an important functional component of automated test equipment (ATE). Waveform generators synthesize signal stimuli to be applied to … Continue reading →

8.1.09 Technical Paper: Modular Oscilloscopes vs. Digitizers

Abstract: Modular instruments are a powerful option in the test equipment designer’s tool kit — especially in automatic test equipment (ATE) applications that require high channel density and digital programmability. They provide all of the needed test functions, without the … Continue reading →

5.9.09 Technical Paper: Performance Evaluation of EPICS Oscilloscopes for Real-Time Waveform Monitoring

Performance Evaluation of EPICS Oscilloscopes for Real-Time Waveform Monitoring Presented at 2009 Particle Accelerator Conference (PAC’09) Written by : Boyd L. Shaw, Johnny Y. Tang Abstract : ZTEC’s EPICS Oscilloscopes have been evaluated to perform simultaneous real-time pass-fail monitoring of … Continue reading →

12.10.08 Technical Paper: “Feature Focus” – Mask Testing

Feature Focus: Mask Testing View Demo: Large Screen | Small Screen About Mask Testing Digital oscilloscope mask testing uses a math channel to compare, point-by-point, a captured waveform to a mask consisting of an upper waveform  limit and a lower … Continue reading →

10.1.08 Technical Paper : Feature Focus- Limit Testing

Abstract : Limit testing is a math function where the oscilloscope captures a waveform, makes a measurement of a waveform parameter, and then compares the measured parameter value to user-defined maximum and minimum values for that parameter. A failure is … Continue reading →