Latest News...

1.23.12 802.11ac WLAN Software for RFIC Test

ZTEC Instruments today announced the release of ZProtocol™ WLAN, a comprehensive 802.11ac demodulation software solution for analysis, characterization and test of the next generation of Wi-Fi RF integrated circuits (RFIC). Continue reading →

10.20.11 RFIC Testing Using PXI Synthetic Instrumentation

The following paper was written by C. D. Ziomek (President) and M. T. Hunter (CTO) of ZTEC Instruments and featured as the main article in the October 18th PXI Newsletter.
Continue reading →

10.20.11 Event Recap: Autotestcon and International Test Conference

In September, the ZTEC Instruments team went bicoastal in a ten day period of time! We attended the 2011 Autotestcon Conference in Baltimore, Maryland, and the 2011 International Test Conference in collaboration with Geotest in Anaheim, California. Continue reading →

9.12.11 Lockheed Martin and AAI Select ZTEC Oscilloscope and RF/IF Digitizer for US Navy’s eCASS Program

ZTEC Instruments today announced that Lockheed Martin and Textron Systems AAI Corp selected the ZT4628 oscilloscope and ZT8442 RF/IF digitizer respectively for the US Navy’s electronic Consolidated Automated Support System (eCASS) to test military aircraft on naval aircraft carriers and shore-based depots. Continue reading →

8.30.11 Vector Signal Analyzer optimized for Wi-Fi & Cellular RFIC Testing in PXI/PXIe

Vector Signal Analyzer (VSA) provides 6 GHz RF & wireless communication test including demodulation personalities for Wi-Fi & Cellular protocols including 802.11ac and LTE. Continue reading →

7.15.11 Newsletter: ZConnect Quarterly – Q2’11

In this issue:
NEW: Company Snapshot!
ZTEC offers Differential Input option on ZT4400 series Instruments
ZT8450 I/Q Digitizer selected for Evaluation Engineering’s Pauls Picks!
Events: TEST WEEK 2011 – Huntsville, AL Continue reading →

7.7.11 2011 Flying 40 Awards

The New Mexico Technology Flying 40 awards annually recognize the 40 fastest-growing technology companies headquartered in New Mexico. Continue reading →

7.6.11 Event Recap: Test Week 2011

In June, Geoff Hoekstra our National Sales Manager, and Gary Tilley our Vice President of Sales and Marketing attended the Test Week Conference in Huntsville, AL. Continue reading →

6.20.11 NEW: Differential-input digitizers offer isolation & noise immunity

ZTEC Instruments adds differential input signal conditioning to its popular high-resolution ZT4400 series digitizers and oscilloscopes for applications requiring ground loop isolation or high noise rejection. Continue reading →

5.11.11 ZTEC Announces I/Q Digitizer optimized for OFDM Testing (WiFi, WiMAX & LTE)

ZTEC Instruments announced today that they have released the next instrument in the Company’s RF & Wireless Communication product line. The ZT8450 I/Q Digitizer functions as a baseband Vector Signal Analyzer (VSA) from DC to 300 MHz. Continue reading →