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4.17.12 Need a Replacement? We’ve got the SOLUTION!

ZTEC Instruments brings you
Replacement SOLUTIONS! Continue reading →

4.16.12 Newsletter: ZConnect Quarterly – Q2’12

Papers & News: Extending the Useable Range of Error Vector Magnitude (EVM) Testing
NEW: ZProtocol has arrived!
Events:
SEMICON WEST: July 10th-12th the ZTEC
SILICON VALLEY TEST CONF. In August Continue reading →

4.5.12 Paper: MIMO RFIC Test Architectures

Abstract: This paper discusses the practical constraints of testing Radio Frequency Integrated Circuit (RFIC) devices in a Multiple-Input Multiple-Output (MIMO) topology. Techniques to optimize test equipment setup and operation for MIMO architectures are detailed. Because RFICs are tested at a device level, this paper focuses on MIMO compliance testing and characterization within a cabled RF environment without open-air antennas. The IEEE 802.11 WLAN protocol is used as an example to detail the theory, specific use cases, and test scenarios. Continue reading →

4.5.12 Event: ZTEC Instruments, Geotest, and Robson Technologies will be hosting a lunch seminar May 15th in Santa Clara, CA.

Come to explore how the PXI platform can offer cost effective test solutions for verification, failure analysis, pilot production, and focused production test applications. Continue reading →

3.28.12 Event: ZTEC Instruments will be seen down under!

Scientific Devices Australia will be showcasing our ZT8441 at the Heavy Ion Accelerator Symposium at the Australian National University in the month of April. Below is the brochure that will be handed out to conference participants. (.pdf attached) Continue reading →

3.28.12 Media Coverage: ZTEC Instruments gets mentioned in EE: Upgrade or Replace: The MIL/Aero ATE Dilemma

MIL/Aero ATE systems with RF/microwave test capabilities are designed to be used for a number of years before being upgraded or replaced. However, the need to continue supporting legacy test program sets (TPS) greatly influences upgrade/replace decisions. Sometimes, these are prompted by test-instrument obsolescence. Other times, technology becomes available that could significantly improve the original ATE specification. Continue reading →

3.26.12 Job Opportunity: Software Engineer Intern

Support the design team in the creation, validation and testing of data acquisition and control software and electronic hardware for modular instrumentation. Support programming in multiple languages is expected to create automated test scripts for hardware and software validation. Create instrumentation drivers and convert existing drivers to new languages. Continue reading →

3.19.12 Extending the Useable Range of Error Vector Magnitude (EVM) Testing

This paper discusses practical constraints of Error Vector Magnitude (EVM) measurements for high-coverage Radio Frequency Integrated Circuit (RFIC) device testing. Noise, distortion, spurious signals, and phase noise all degrade EVM, and therefore EVM provides a comprehensive measure of an RFIC’s quality of use in digital communications. New wireless standards with large instantaneous bandwidths, such as 802.11ac WLAN and LTE-Advanced, make EVM thresholds more difficult to achieve. This paper describes techniques to optimize test equipment setup and operation to extend the useable range in frequency, power and instantaneous bandwidth of EVM-based testing. Continue reading →

3.7.12 Job Opportunity: Electrical Engineer

Full-time position in a dynamic and high growth startup business environment as an Electrical Engineer to contribute to the technical research and development of state-of-the-art electronic instrumentation. Continue reading →

1.31.12 Media Coverage: ZTEC Instruments gets mention in EE Times and EE Times India article!

ZTEC Instruments introduces a comprehensive 802.11ac demodulation software solution for the analysis, characterisation and test of the next generation of Wi-Fi RFICs. The ZProtocol WLAN software is said to be a fast, flexible and easy to use test software. Continue reading →