<?xml version="1.0" encoding="utf-8"?>
<!DOCTYPE rss [<!ENTITY % HTMLlat1 PUBLIC "-//W3C//ENTITIES Latin 1 for XHTML//EN" "http://www.w3.org/TR/xhtml1/DTD/xhtml-lat1.ent">]>
<rss version="2.0" xml:base="http://www.ztecinstruments.com">
<channel>
 <title>ZTEC Instruments - June 4, 2008</title>
 <link>http://www.ztecinstruments.com/taxonomy/term/276/all</link>
 <description></description>
 <language>en</language>
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 <title>ZT4210 PXI, PCI and VXI Oscilloscopes: Benchtop Performance for ATE, Embedded, &amp; General Purpose Test Systems</title>
 <link>http://www.ztecinstruments.com/zt-4210-pc-oscilloscope-with-benchtop-performance-for-ate-embedded-general-purpose-test-systems</link>
 <description>&lt;a href=&quot;family/zt4210&quot;&gt;&lt;img src=&quot;images/newsletter-zt4210-zscope.jpg&quot;&gt;&lt;/a&gt;
&lt;p&gt;Since the introduction of the &lt;a href=&quot;family/zt4210&quot;&gt;ZT4210 series of oscilloscopes&lt;/a&gt; in late April, engineers have discovered that these new scopes have the flexibility, performance and specifications necessary to solve a myriad of ATE, embedded, and portable test  applications. Features such as flexible input signal conditioning and on-board waveform math and analysis, and key specifications, such as 300 MHz bandwidth and 256M samples of memory make the ZT4210 a powerful all-around oscilloscope. Additionally, ZTEC’s software applications, tools, and programming examples enable users to easily integrate the ZT4210 into test systems and to interface programmatically with the instrument. This article discusses just a few of the ZT4210’s many features and capabilities as they relate to solving common ATE, embedded and general purpose testing needs.&lt;/p&gt;</description>
 <category domain="http://www.ztecinstruments.com/taxonomy/term/276">June 4, 2008</category>
 <pubDate>Tue, 03 Jun 2008 17:19:39 -0600</pubDate>
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 <title>ZTEC Focuses on Industry Solutions</title>
 <link>http://www.ztecinstruments.com/aerospace-defense-high-energy-physics-semiconductor-oscillosopes</link>
 <description>&lt;a href=&quot;applications&quot;&gt;&lt;img src=&quot;images/newsletter-app-feature.jpg&quot;&gt;&lt;/a&gt;
&lt;p&gt;ZTEC provides modular test solutions that are designed to solve general purpose testing needs while also addressing the special requirements found in aerospace, defense, high-energy physics and semiconductor applications.&lt;/a&gt;
&lt;p&gt;&lt;a href=&quot;applications&quot;&gt;View all industry solutions &gt;&gt;&lt;/a&gt;&lt;/p&gt;</description>
 <category domain="http://www.ztecinstruments.com/taxonomy/term/276">June 4, 2008</category>
 <pubDate>Tue, 03 Jun 2008 11:06:46 -0600</pubDate>
</item>
</channel>
</rss>
