ZT412-50 VXI
Agilent (HP) E1429B Replacement Solution
The Agilent / HP E1429B VXIbus oscilloscope is a differential oscilloscope that has been used for years in many ATE systems. Differential
inputs are especially useful when input signals have undesirable common-mode components that must be rejected. The E1429B has been obsolete for
years and a replacement is not available from Agilent. Fortunately, ZTEC has extensive experience with VXIbus oscilloscopes and the discontinued
Agilent instruments in particular. The ZTEC ZT412-50 VXI is a modern VXI oscilloscope that provides extensive functionality, in most cases
beyond that of the E1429B. Whereas the Agilent E1429B is a low-sample rate differential 12-bit oscilloscope, the ZT412-50 is a high sample
rate pseudo-differential 16-bit oscilloscope. The E1429B has two separate input paths for each of its two ADCs: a single-ended path and a
differential path. The ZT412-50 provides pseudo-differential inputs by using a math channel to difference a pair of its four single-ended
inputs (using four ADCs and a DSP processor). The resulting differential waveforms for both oscilloscopes will be similar, but the internal
architectures are different. Note that the ZT412-50 has an input offset zero self-calibration function that is particularly useful to zero
out the common mode error for the pseudo-differential configuration. The table below provides a complete list of the differences between the
E1429B and the ZT412-50. Note that the other specifications not listed below will be comparable for both instruments.
Because the instrument functionality, command set, and I/O ranges are different, there is some effort involved with the integration of the ZT412-50 in place of the E1429B. ZTEC's application engineering team has significant experience with the functional differences between the E1429B and the ZT412-50, as well as the application details of using VXI oscilloscopes in ATE test programs. This experience is invaluable when assisting a test system integrator in successfully modifying an existing ATE system or TPS. Having successfully assisted customers with instrument replacement issues, the team at ZTEC appreciates the effort involved in additional test software development, validation and support required to replace an obsolete instrument.
| Specification | E1429B | ZT412-50 |
|---|---|---|
| Sample Rate | 0.05 S/s to 20 MS/s | 10 kS/s to 400 MS/s |
| Maximum Memory | 524,288 points | 1,048,576 points |
| Maximum Sweep Time | 7.28 hours | 104.9 s |
| Input Channels | 2 Single-Ended,
2 Differential |
4 Single-Ended,
2 Pseudo-Differential |
| Input Impedance | 50 Ω or 75 Ω Single-Ended
1 MΩ Differential |
50 Ω or 1 MΩ Single-Ended,
50 Ω or 1 MΩ Differential |
| Input Bandwidth | 40-50 MHz Single-Ended
2-15 MHz Differential |
250 MHz (50 Ω)
125 MHz (1 MΩ) |
| Input Coupling | DC, LPF 10MHz | DC, AC |
| Maximum Input | 5 VDC (Single-Ended)
102.3 VDC (Differential) |
5 VDC (50 Ω)
25 VDC (1 MΩ Single-Ended) 50 VDC (1 MΩ Differential) |
| Voltage Ranges | 0.2 to 2 Vpp, 4 steps (Single-Ended)
0.2 to 200 Vpp, 10 steps (Differential) |
0.05 to 10 Vpp, 8 steps (50 Ω)
0.5 to 100 Vpp, 8 steps (1 MΩ Differential) |
| ADC resolution | 12 bit | 16 bit |
| DC Gain Accuracy | 0.25% (Single-Ended)
1% (Differential) |
0.25% (Single-Ended)
0.5% (Differential) |
| External In/Out | Ext 1 (Arm Out, Trigger Out, Arm In, Trigger In),
Ext 2 (Clock In, Trigger In) |
Arm In, Clock In, Trigger In, Ref Out (DC Cal, AC Cal, Trigger Out, Arm Out, 10 MHz, Pulse) |
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